At the beginning of the 1970s is stilla relatively high failure rates of electronic components were tolerable in [[automobile]]s, because they replaced mechanical components, which had a much higher [[failure rate]]. The underlying failure rates of bimetallic [[flasher]]s were 10% per year and the lifetime of mechanical [[Breaker [|ignition contacts]] at 10,000 miles. With the increasing number of [[semiconductor]]s in [[controllercontrol units]]s, and the introduction of the first safety systems ([[anti-lock brakes | ABS]]) in the 70s washad to be addressed. Already in 1975, the'' General Specification for IC's was in Automotive Applications'' <ref> General Specification for ICs in Automotive Applications, SAE RecommondationRecommendation, 1975 </ref> as the first'' [[Society of Automotive Engineers | SAE ]] Recommendation was issued'','' the 1978 SAE standard'' <ref> General Specification for ICs in Automotive Applications, SAE standard, 1978, </ref> was declared and adopted by major semiconductor manufacturers.
The establishment of the Automotive Electronic Council ([[Automotive Electronics Council | AEC]]) 1994 by [[Ford]], [[Chrysler]], [[General Motors | GM]] - [[ACDelco | Delco]] was also the Starting point for the AEC-Q100 qualification process <ref> Automotive Electronic Council's Stress Test Qualification for Integrated Circuits, AEC Q100, Rev. G, 2007, to [http://www.aecouncil.com/AECDocuments.html aecouncil.com] </ref>, was based on the SAE standards.
In this process is to decide by nonspecific tests to cover a wide range of possible failure mechanisms, but only on the functionality of the component. Due to the development of [[automotive]] and the ever-increasing complexity of vehicles associated with the demands for lower error rates of this qualification process , this process to decide by nonspecific tests, to cover a wide range of possible failure mechanisms, but only on the functionality of the component is out of date. In order to make statements about the robustness AEC Q100 can, should be replaced by AEC Q100 robustness validation.
