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Due to the development of [[automotive]] and the ever-increasing complexity of vehicles associated with the demands for lower error rates of this qualification process , this process to decide by nonspecific tests, to cover a wide range of possible failure mechanisms, but only on the functionality of the component is out of date. In order to make statements about the robustness AEC Q100 can be replaced robustness validation.
== Initiators and participants ==
In April 2007, the'' Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications'' <ref name="RVHB_SC">'' Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications'' ZVEI, 04/2007 </ ref> with international cooperation from SAE, [[ZVEI]], AEC and [[JSAE]] (Japanese Society of Automotive Engineers) was published, in which the guidelines for the contemporary [[validation (Electronic Design Automation) | validation]] of semiconductor components in the automotive applications were compiled. Companies were involved in this from the entire [[supply chain]] in the field of automotive electronics. In addition to vehicle manufacturers and suppliers, a large group of semiconductor manufacturers, this concept of skill is complemented with a current database. This so-called Knowledge Matrix <ref> [http://www.zvei.org/index.php?id=3796 Knowledge matrix with zvei.org] </ ref> is a list of currently known failures includes mechanisms with causes, error methods and further information.
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