Robustness validation: Difference between revisions

Revision as of 14:39, 21 September 2012

Revision as of 14:40, 21 September 2012

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== History ==

At the beginning of the 1970s a relatively high failure rates of electronic components were tolerable in [[automobile]]s, because they replaced mechanical components, which had a much higher [[failure rate]]. The underlying failure rates of bimetallic [[flasher]]s were 10% per year and the lifetime of mechanical [[Breaker|ignition contacts]] at 10,000 miles. With the increasing number of [[semiconductor]]s in [[control unitsunit]]s, and the introduction of the first safety systems ([[anti-lock brakes | ABS]]) in the 70s had to be addressed. Already in 1975, the'' General Specification for IC's in Automotive Applications'' <ref> General Specification for ICs in Automotive Applications, SAE Recommendation, 1975 </ref> as the first'' [[Society of Automotive Engineers | SAE ]] Recommendation was issued'','' the 1978 SAE standard'' <ref> General Specification for ICs in Automotive Applications, SAE standard, 1978, </ref> was declared and adopted by major semiconductor manufacturers.

The establishment of the Automotive Electronic Council ([[Automotive Electronics Council | AEC]]) 1994 by [[Ford]], [[Chrysler]], [[General Motors | GM]] - [[ACDelco | Delco]] was also the Starting point for the AEC-Q100 qualification process <ref> Automotive Electronic Council's Stress Test Qualification for Integrated Circuits, AEC Q100, Rev. G, 2007, to [http://www.aecouncil.com/AECDocuments.html aecouncil.com] </ref>, was based on the SAE standards.