Revision as of 21:02, 20 June 2013 edit Unbuttered Parsnip (talk \| contribs) 15,948 edits No edit summary ← Previous edit		Revision as of 03:11, 25 June 2013 edit undo Hipal (talk \| contribs) Extended confirmed users, Pending changes reviewers, Rollbackers 140,454 edits →See also: linkspam Next edit →
Line 155: ==See also== [[Reliability (semiconductor)]] [http://www.dfrsolutions.com/white-papers/beyond-bearing-wearout-why-current-testing-of-fans-is-insufficient-and-understanding-dfrs-solution/ "Beyond Bearing Wearout Fan Testing"] ==References==

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