Automatic test pattern generation: Difference between revisions

Revision as of 17:09, 10 September 2013

Revision as of 21:10, 27 October 2013

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*Methods based on [[Boolean satisfiability]] are sometimes used to generate test vectors.

*'''Pseudorandom test generation''' is the simplest method of creating tests. It uses a [[pseudorandom]] number generator to generate test vectors, and relies on logic simulation to compute good machine results, and fault simulation to calculate the fault coverage of the generated vectors.

* '''Wavelet Automatic Spectral Pattern Generator''' ([[WASP]]) is an improvement over spectral algorithms for sequential ATPG. It uses wavelet heuristics to search space to reduce computation time and accelerate the compactor. It was put forward by [[Suresh kumar Devanathan]] and Michael Bushnell, Rutgers University.

== Relevant Conferences ==