Automatic test pattern generation: Difference between revisions

Revision as of 16:26, 22 November 2013

Revision as of 16:46, 22 November 2013

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* Early test generation algorithms such as [[boolean difference]] and [[literal proposition]] were not practical to implement on a computer.

* The '''D Algorithm''' was the first practical test generation [[algorithm]] in terms of memory requirements. The D Algorithm [proposed by J.P Roth 1966] introduced '''D Notation''' which continues to be used in most ATPG algorithms. D Algorithm tries to propagate the stuck at fault value denoted by D or \overline{D}' to a primary output.

* '''Path-Oriented Decision Making''' (PODEM) is an improvement over the D Algorithm. PODEM was created in 1981, by [[Prabhu Goel]], when shortcomings in D Algorithm became evident when design innovations resulted in circuits that D Algorithm could not realize.

* '''Fan-Out Oriented''' ([[FAN Algorithm]]) is an improvement over PODEM. It limits the ATPG search space to reduce computation time and accelerates backtracing.