Revision as of 12:53, 23 November 2013 edit SiavooshPayandehAzad (talk \| contribs) 60 edits →Fault models ← Previous edit		Revision as of 13:28, 23 November 2013 edit undo SiavooshPayandehAzad (talk \| contribs) 60 edits →Delay faults Next edit →
Line 32: ==== Delay faults ==== * Gate delay fault * Transition fault * Path delay fault == Combinational ATPG ==

Automatic test pattern generation: Difference between revisions