Features from accelerated segment test: Difference between revisions

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| year=2005 | doi=10.1109/ICCV.2005.104 | volume=2| pages=1508–1511}}
 
* {{cite journal | last=Rosten | first=Edward | coauthorsauthor2=Reid Porter, |author3=Tom Drummond | title=FASTER and better: A machine learning approach to corner detection | journal=IEEE Trans. Pattern Analysis and Machine Intelligence
| url=http://lanl.arXiv.org/pdf/0810.2434
| year=2010 | doi=10.1109/TPAMI.2008.275 | volume=32| pages=105–119}}