Revision as of 07:16, 2 June 2006 edit 67.112.121.21 (talk) →FAN was pointing to wrong link ← Previous edit		Revision as of 00:25, 1 July 2006 edit undo 192.18.42.10 (talk) →The ''Stuck-at'' fault model Next edit →
Line 9: A pattern set with 100% stuck-at fault coverage consists of tests to detect every possible stuck-at fault in a circuit. 100% stuck-at fault coverage does not necessarily guarantee high quality, since faults of many other kinds -- such as bridging faults, opens faults, and transition (aka delay) faults -- often occur. gfgfggf == Sequential ATPG ==

Automatic test pattern generation: Difference between revisions