Automatic test pattern generation: Difference between revisions

Revision as of 00:25, 1 July 2006

Revision as of 03:45, 1 July 2006

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A pattern set with 100% stuck-at fault coverage consists of tests to detect every possible stuck-at fault in a circuit. 100% stuck-at fault coverage does not necessarily guarantee high quality, since faults of many other kinds -- such as bridging faults, opens faults, and transition (aka delay) faults -- often occur.

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== Sequential ATPG ==