Microscopio a effetto tunnel: differenze tra le versioni

Versione delle 22:59, 2 ott 2013

Versione delle 05:27, 21 ott 2013

Riga 356:

* {{En}} R. V. Lapshin, Feature-oriented scanning methodology for probe microscopy and nanotechnology, [http://stacks.iop.org/Nano/15/1135 Nanotechnology, volume 15, issue 9, pages 1135-1151, 2004]

* {{En}} D. Fujita and K. Sagisaka, Topical review: Active nanocharacterization of nanofunctional materials by scanning tunneling microscopy [http://dx.doi.org/10.1088/1468-6996/9/1/013003 Sci. Technol. Adv. Mater. 9, 013003(9pp) (2008)] (free download).

* {{En}} {{cita libro|url=http://books.google.com/books?id=EXae0pjS2vwC&printsec=frontcover|titolo=Scanning probe microscopy and spectroscopy: methods and applications|autore=Roland Wiesendanger|editore=Cambridge University Press|yearanno=1994|isbn=0-521-42847-5}}

* {{En}} ''Theory of STM and Related Scanning Probe Methods.'' Springer Series in Surface Sciences, Band 3. Springer, Berlin 1998