Revision as of 04:22, 13 January 2017 edit 134.204.193.36 (talk) →See also ← Previous edit		Revision as of 10:41, 6 February 2017 edit undo Thelisteningman (talk \| contribs) 71 edits m →See also: Added missing links Next edit →
Line 70: * [[Design For Test]] (DFT) * [[Fault model]] * [[Built-in_self-test\|Built-In Self-Test]] (BIST) * BIST * [[JTAG]] * [[Boundary Scan]] (BSCAN) * [[ASIC]] * [[VHSIC]]

Automatic test pattern generation: Difference between revisions