Content deleted Content added
No edit summary |
|||
Line 15:
== See also ==
* [[Flat-field correction]] <ref>{{cite journal | authors = V. Van Nieuwenhove, J. De Beenhouwer, F. De Carlo, L. Mancini, F. Marone, and J. Sijbers | doi = 10.1364/OE.23.027975 | title = Dynamic intensity normalization using eigen flat fields in X-ray imaging | journal = Optics Express | volume = 23 | issue = 21 | date = 2015 | pages = 27975–27989}}</ref>
== References ==
|