Revision as of 10:44, 9 November 2015 edit Qwertyus (talk \| contribs) Extended confirmed users 31,640 edits m Qwertyus moved page Test and Test-and-set to Test and test-and-set ← Previous edit		Revision as of 18:54, 9 May 2017 edit undo Julesd (talk \| contribs) Extended confirmed users 15,605 edits mNo edit summary Tag: Visual edit Next edit →
Line 17: } The entry protocol uses normal memory reads to spin, waiting for the lock to become free. Test-and-set is only used to try to get the lock when normal memory read says it's free. Thus the expensive atomic memory operations ~~happens~~happen less often than in simple spin around test-and-set. If the [[programming language]] used supports [[short-circuit evaluation]], the entry protocol could be implemented as:

Test and test-and-set: Difference between revisions