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Line 78: == References == ''Electronic Design Automation For Integrated Circuits Handbook'', by Lavagno, Martin, and Scheffer, {{ISBN \|0-8493-3096-3}} A survey of the field, from which the above summary was derived, with permission. {{cite book\| title=Microelectronics Failure Analysis \| year=2004 \|publisher=ASM International \| ___location=Materials Park, Ohio\| isbn= 0-87170-804-3 }} <references/>

Automatic test pattern generation: Difference between revisions