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In [[electrical engineering]], a '''shmoo plot''' is a graphical display of the response of a component or system varying over a range of conditions and inputs.
== Description== Shmoo plots are often used to represent the results of the testing of complex electronic systems such as computers or integrated circuits such as [[DRAM]]s, ASICs or microprocessors. The plot usually shows the range of conditions in which the [[device under test]] operates (in adherence with some remaining set of specifications). For example, when testing [[semiconductor]] [[memory]]: [[voltage]]s, [[temperature]], and [[refresh rate]]s can be varied over specified ranges and only certain combinations of these factors will allow the device to operate. Plotted on independent axes (voltage, temperature, refresh rates), the range of working values will enclose a three-dimensional, usually oddly-shaped volume. Other examples of conditions and inputs that can be varied include [[frequency]], [[temperature]], timing parameters, system- or component-specific variables, and even varying knobs tweakable during [[silicon chip fabrication]] producing parts of varying quality which are then used in the process.
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The invention of the shmoo plot is credited to VLSI Hall Of Fame inductee [[Robert Huston]] (died 2006).<ref>[https://www.chiphistory.org/TCI%20All_Stars-Hall_of_Fame%20161212.pdf VLSIresearch’s CHIP MAKING INDUSTRY HALL OF FAME], VLSI Research Inc.</ref>
The term was in use in 1970 to refer to the "tuning" of ferrite core memory stacks on IBM systems.{{fact|date=June 2017}}
== Etymology ==
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