Content deleted Content added
rearrange. At least 1960s is clear now, so remove Baker and van Beers references |
→Examples: restore shorter baker + van beers article as an EL |
||
Line 32:
A limitation of the technique is that the extended duration of testing of the device may cause additional internal device heating, resulting in a skewing of the data (later tested cells on the plot may perform worse than earlier ones). One way of avoiding this is to exercise the device thoroughly in a similar manner immediately before the actual shmoo test.
== External links ==
* [http://doi.ieeecomputersociety.org/10.1109/TEST.1996.557162 Shmoo Plotting: The Black Art of IC Testing], Keith Baker and Jos van Beers, [[IEEE]] International Test Conference, 1996
==References==
| |||