Deep reactive-ion etching: Difference between revisions

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Revision as of 06:14, 17 September 2017

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'''Deep reactive-ion etching''' ('''DRIE''') is a highly [[anisotropy|anisotropic]] [[etching (microfab)|etch]] process used to create deep penetration, steep-sided holes and trenches in [[wafer (semiconductor)|wafer]]s/substrates, typically with high [[aspect ratio (image)|aspect ratio]]s . It was developed for [[microelectromechanical systems]] (MEMS), which require these features, but is also used to excavate trenches for high-density [[capacitor]]s for [[dynamic random access memory|DRAM]] and more recently for creating through silicon vias ([[Through-silicon via|TSVs]]) in advanced 3D wafer level packaging technology .

There are two main technologies for high-rate DRIE: cryogenic and Bosch, although the Bosch process is the only recognised production technique. Both Bosch and cryo processes can fabricate 90° (truly vertical) walls, but often the walls are slightly tapered, e.g. 88° ("reentrant") or 92° ("retrograde").