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== Detected faults ==
Memory testers are designed to detect two types of faults that affect the functional behavior of a system (
* Non-Permanent faults ▼
Permanent faults affect the logic values in the system permanently, these faults are easier to detect using a memory tester. Examples include:▼
*Incorrect connections between [[integrated circuit]]s, boards….etc. (e.g. missing connections or shorts due to solder splashes or design fault) ▼
*Broken component or parts of components ▼
*Incorrect IC Mask, (Manufacturing problem) ▼
*Functional design errors (logical function that had to be implemented, is designed incorrectly).▼
===Non-permanent faults===
Non-Permanent faults occur at random moments. They affect a system's behavior for an unspecified period of time. The detection and localization of non-permanent faults are extremely difficult with a memory tester. Sometimes non-permanent faults will not affect the system's operation during testing.
There are two types of non-permanent faults
Transient faults are hard to detect, and there are no well defined faults to detect. Errors in RAM introduced by transient faults are often called software errors, the following examples are possible factors that will contribute to transient faults :
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*Physical irregularities
*Noise (noise disturbs signals in the system)
▲Permanent faults affect the logic values in the system permanently, these faults are easier to detect using a memory tester. Examples include:
▲*Incorrect connections between [[integrated circuit]]s, boards….etc. (e.g. missing connections or shorts due to solder splashes or design fault)
▲*Broken component or parts of components
▲*Incorrect IC Mask, (Manufacturing problem)
▲*Functional design errors (logical function that had to be implemented, is designed incorrectly).
== See also ==
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