Revision as of 01:37, 1 May 2018 edit 104.162.111.207 (talk) Typo in quote from Rosten's original paper ← Previous edit		Revision as of 17:09, 10 November 2018 edit undo JCW-CleanerBot (talk \| contribs) Bots 137,069 edits m →Bibliography: clean up, replaced: IEEE Trans. Pattern Analysis and Machine Intelligence → IEEE Transactions on Pattern Analysis and Machine Intelligence Tag: AWB Next edit →
Line 161: \| year=2005 \| doi=10.1109/ICCV.2005.104 \| volume=2\| pages=1508–1511}} * {{cite journal \| last=Rosten \| first=Edward \|author2=Reid Porter \|author3=Tom Drummond \| title=FASTER and better: A machine learning approach to corner detection \| journal=IEEE ~~Trans.~~Transactions on Pattern Analysis and Machine Intelligence \| arxiv=0810.2434\| year=2010 \| doi=10.1109/TPAMI.2008.275 \| volume=32\| pages=105–119}}

Features from accelerated segment test: Difference between revisions