Reflection high-energy electron diffraction: Difference between revisions

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Revision as of 07:05, 3 March 2019

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===Dynamic scattering analysis===

The dynamically, or inelastically, scattered electrons provide several types of information about the sample as well. The brightness or intensity at a point on the detector depends on dynamic scattering, so all analysis involving the intensity must account for dynamic scattering.<ref name="ichimiya2004"/><ref name="braun1999"/> Some inelastically scattered electrons penetrate the bulk crystal and fulfill Bragg diffraction conditions. These inelastically scattered electrons can reach the detector to yield kikuchi diffraction patterns, which are useful for calculating diffraction conditions.<ref name="braun1999"/> Kikuchi patterns are characterized by lines connecting the intense diffraction points on a RHEED pattern. Figure 6 shows a RHEED pattern with visible [[Kikuchi line (solid state physics)|Kikuchi lines]]s.

[[File:TiO2 Surface with Kikuchi Lines.gif|thumbnail|400px|'''Figure 6'''. A RHEED pattern from a TiO₂ (110) surface with visible Kikuchi lines. The Kikuchi lines pass through the Laue circles and appear to radiate from the center of the pattern.]]