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[[File:Figure 5. Shmoo plots with test period power supply test on a few FE-I4 devices.png|thumb|Two-colored Shmoo plots for comparing good and bad devices]]
Automated test equipment have traditionally generated a two-dimensional, [[ASCII]] form of the shmoo plot that uses an "X" to represent functional points and blank space for non-functional points. In modern times plots with two colors (e.g. red/green) or even multi colored plots in form of digital spread sheet documents and alike became also common, even if the traditional form is still in use<ref>[https://www.researchgate.net/publication/305762550_A_28-nm_484-fJwritecycle_650-fJreadcycle_8T_Three-Port_FD-SOI_SRAM_for_Image_Processor Energy optimization for an 28 nm sized storage semiconductor using ASCII Shmoo plots for read and write metrics, dated 2016]</ref>. For testing efficiency sometimes only the border of interest (where a certain value changes its state) is backed up with data in the diagrams thus (often reasonably) assuming the areas outside those transition will stay at those state.<ref>[https://www.edn.com/electronics-blogs/day-in-the-life-of-a-chip-designer/4438729/Silicon-debug-challenges-and-guidelines Examples for thinned out, multi-color Shmoo diagrams, dated 2015</ref>
If sufficiently-wide ranges of the two independent variables were to be tested, a normal shmoo plot would show an operating envelope of some shape not unlike Al Capp's [[Shmoo]], but in practice, this might damage the [[device under test]], and finer-grained views are of much more interest, particularly focusing on published component margins (e.g., - 5% Vcc). When this is done, the operating envelope typically extends to the border of the plot in one or more directions.
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