Reflection high-energy electron diffraction: Difference between revisions

Revision as of 07:05, 3 March 2019

Revision as of 20:52, 21 March 2019

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{{short description|Technique in crystallography}}

'''Reflection high-energy electron diffraction''' ('''RHEED''') is a [[analytical technique|technique]] used to characterize the surface of [[crystalline]] materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other [[material characterization|materials characterization]] methods that also rely on diffraction of high-energy [[electrons]]. [[Transmission electron microscopy]], another common [[electron diffraction]] method samples the bulk of the sample due to the geometry of the system. [[Low-energy electron diffraction]] (LEED) is also surface sensitive, but LEED achieves surface sensitivity through the use of low energy electrons.