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The '''contrast transfer function''' (CTF) mathematically describes how aberrations in a [[transmission electron microscope]] (TEM) modify the image of a sample.<ref name=":0">{{Cite journal|title = A brief look at imaging and contrast transfer|last = Wade|first = R. H.|date = October 1992|journal = Ultramicroscopy|doi = 10.1016/0304-3991(92)90011-8|pmid = |volume=46|issue = 1–4|pages=145–156}}</ref><ref name="Spence1982">Spence, John C. H. (1988 2nd ed) ''Experimental high-resolution electron microscopy'' (Oxford U. Press, NY) {{ISBN|0195054059}}.</ref><ref name="Reimer97">Ludwig Reimer (1997 4th ed) ''Transmission electron microscopy: Physics of image formation and microanalysis'' (Springer, Berlin) [https://books.google.com/books?id=3_84SkJXnYkC preview].</ref><ref name="Kirkland1998">Earl J. Kirkland (1998) ''Advanced computing in electron microscopy'' (Plenum Press, NY).</ref> This contrast transfer function (CTF) sets the resolution of [[high-resolution transmission electron microscopy]] (HRTEM), also known as phase contrast TEM.
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The contrast transfer function can also be given in terms of spatial frequencies, or reciprocal space. With the relationship <math display="inline">\theta =\lambda k</math>, the phase contrast transfer function becomes:
:<math>K(k) = \sin[(2\pi
<math>z</math> = the defocus of the objective lens (using the convention that underfocus is positive and overfocus is negative), <math>\lambda</math> = the relativistic wavelength of the electron wave, <math>C_s</math> = The [[spherical aberration]] of the objective lens, <math>k</math> = the spatial frequency (units of m<sup>−1</sup>)
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