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* '''Fan-Out Oriented''' ([[FAN Algorithm]]) is an improvement over PODEM. It limits the ATPG search space to reduce computation time and accelerates backtracing.
*Methods based on [[Boolean satisfiability]] are sometimes used to generate test vectors.
*'''Pseudorandom test generation''' is the simplest method of creating tests. It uses a [[pseudorandom]] number generator to generate test vectors, and relies on [[logic simulation]] to compute good machine results, and fault simulation to calculate the fault coverage of the generated vectors.
* '''Wavelet Automatic Spectral Pattern Generator''' (WASP) is an improvement over spectral algorithms for sequential ATPG. It uses wavelet heuristics to search space to reduce computation time and accelerate the compactor. It was put forward by [[Suresh kumar Devanathan]] from Rake Software and Michael Bushnell, Rutgers University. [[Suresh kumar Devanathan]] invented WASP as a part of his thesis at Rutgers.{{citation needed}}
== Relevant conferences ==
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