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=== Classification Tree Method for Embedded Systems ===
The classification tree method first was intended for the design and specification of abstract test cases. With the classification tree method for embedded systems,<ref name="conrad">{{cite journal|last=Conrad|first=Mirko|author2=Krupp, Alexander|title=An Extension of the Classification-Tree Method for Embedded Systems for the Description of Events|journal=Electronic Notes in Theoretical Computer Science|date=1 October 2006|volume=164|issue=4|pages=3–11|doi=10.1016/j.entcs.2006.09.002|doi-access=free}}</ref> test implementation can also be performed. Several additional features are integrated with the method:
# In addition to atomic test cases, test sequences containing several test steps can be specified.
# A concrete timing (e.g. in Seconds, Minutes ...) can be specified for each test step.
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