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Federal
NIST X-ray Photoelectron Spectroscopy Database - SRD 20
National Institute of Standards and Technology —
NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for... -
Federal
NIST Electron Inelastic-Mean-Free-Path Database - SRD 71
National Institute of Standards and Technology —
The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-... -
Federal
NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) - SRD 100
National Institute of Standards and Technology —
The NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) can be used to simulate Auger-electron spectra and X-ray photoelectron spectra...